Repetitive Testing Strategies When the Testing Process Is Imperfect

References

• Chakravarty A. K., Shtub A. Strategic allocation of inspection effort in a serial, multi-product production system. IIE Trans. (1987) 3:13–22Crossref, Google Scholar
• Charnes A., Cooper W. W. Chance-constrained programming. Management Sci. (1959) 5:73–79Link, Google Scholar
• Drury C. G., Karwan M. H., Vanderwarker D. R. The two-inspector problem. IIE Trans. (1986) 18:174–181Crossref, Google Scholar
• Duffuaa S. O., Raouf A. An optimal sequence in multicharactereistic inspection. J. Optim. Theory and Appl. (1990) 67:79–86Crossref, Google Scholar
• Eppen Gary D., Gerald Hurst E. Optimal location of inspection stations in a multistage production process. Management Sci. (1974) 20:1194–1200Link, Google Scholar
• Greenberg Betsy S., Lynne Stokes S. Repetitive testing in the presence of inspection errors. Technometrics (1995) 37:102–111Crossref, Google Scholar
• Harry Michael J., Ronald Lawson J.Six Sigma Producibility Analysis and Process Characterization (1992) (Addison-Wesley, Reading, MA) Google Scholar
• Jaraiedi Majid, Kochhar Dev S., Jasingh Suresh C. Multiple inspections to meet desired outgoing quality. J. Quality Tech. (1987) 19:46–51Crossref, Google Scholar
• Lee Hau. Lot sizing to reduce capacity utilization in a production process with defective items process corrections, and rework. Management Sci. (1992) 38:1314–1328Link, Google Scholar
• McIvor Robert. Managing for Profit in the Semiconductor Industry (1989) (Prentice Hall, Englewood Cliffs NJ) Google Scholar
• Peters Michael H., Williams William W. Location of quality inspection stations: An experimental assessment of five normative heuristics. Decision Sciences (1984) 15:389–408Crossref, Google Scholar
• Peters Michael H., Williams William W. Economic design of quality monitoring efforts for multi-stage production systems. IIE Trans. (1987) 3:81–87Crossref, Google Scholar
• Port Otis. Huh? Chipmakers copying steelmakers? Business Week (1994) August 15):97–98Google Scholar
• Raouf A., Jain J. K., Sathe P. T. A cost-minimization model for multicharacteristic component inspection. IIE Trans. (1983) 15:187–194Crossref, Google Scholar
• Raz Tzvi. A survey of models for allocation inspection effort in multistage production systems. J. Quality Tech. (1986) 18:239–246Crossref, Google Scholar
• Raz Tzvi, Bricker Dennis. Sequencing of imperfect inspection operations subject to constraints on the quality of accepted and rejected units. Internat. J. Production Res. (1987) 25:809–821Crossref, Google Scholar
• Raz Tzvi, Kaspi Moshe. Location and sequencing of imperfect inspection operations in serial multi-stage production systems. Internat. J. Production Res. (1991) 29:1645–1659Crossref, Google Scholar
• Raz Tzvi, Thomas M. U. A method for sequencing inspection activities subject to errors. IIE Trans. (1983) 15:12–18Crossref, Google Scholar
• Ross Sheldon M.Stochastic Process (1983) (John Wiley, New York) Google Scholar
• Savir Jacob. AC product defect level and yield loss. IEEE Trans. on Semiconductor Manufacturing (1990) 3:195–205Crossref, Google Scholar
• Tang Kwei, Tang Jen. Design of screening procedures: A review. J. Quality Tech. (1994) 26:209–226Crossref, Google Scholar
• Yum Bong J., McDowell Edward D. The optimal allocation of inspection effort in a class of nonserial production systems. AIIE Trans. (1981) 13:285–293Crossref, Google Scholar