Process Innovation and Learning by Doing in Semiconductor Manufacturing

Published Online:https://doi.org/10.1287/mnsc.44.11.1461

References

  • Adler P. S., Clark K. B. Behind the learning curve: A sketch of the learning process. Management Sci. (1991) 37(3):267–281LinkGoogle Scholar
  • Alchian A. Reliability of progress curves in airframe production. Econometrica (1963) 31:679–693CrossrefGoogle Scholar
  • Alvarez A. R. (1994) . Process requirements through 2001. Presented at the Second International Rapid Thermal Processing Conference, Monterey, CaliforniaGoogle Scholar
  • Arrow K. The economic implications of learning by doing. Rev. Econom. Stud. (1962) 29:155–173CrossrefGoogle Scholar
  • Baloff N. Extension of the learning curve. Oper. Res. Quart. (1971) 22:329–340CrossrefGoogle Scholar
  • Carlton J. Apple, IBM, Motorola Power PC group issues blueprint for a common computer. Wall Street Journal (1995) 33(Nov. 15):86Google Scholar
  • Conway R., Schultz A. The manufacturing progress function. J. Indust. Engrg. (1959) 10:39–53Google Scholar
  • DeJong J. The effects of increasing skill on cycle time and its consequences for time standards. Ergonomics (1957) 1(1):51–60CrossrefGoogle Scholar
  • Dertouzos M., Lester R., Solow R.Made in America (1988) (MIT Press, Cambridge, Massachusetts) Google Scholar
  • Dick A. R. Learning by doing and dumping in the semiconductor industry. J. Law Econom. (1991) 34:133–159CrossrefGoogle Scholar
  • Dudley L. Learning and productivity changes in metal products. Amer. Econom. Rev. (1972) 62:662–669Google Scholar
  • Gruber H. The learning curve in the production of semiconductor memory chips. Appl. Econom. (1992) 24:885–894CrossrefGoogle Scholar
  • Hatch N. W., Reichelstein S. Learning effects in semiconductor fabrication. (1997) . Unpublished manuscript, University of Illinois at Urbana-ChampaignGoogle Scholar
  • Hirsch W. Z. Progress functions of machine tool manufacturing. Econometrica (1952) 20(1):81–82Google Scholar
  • Hirschmann W. B. Profit from the learning curve. Harvard Bus. Rev. (1964) 42(1):125–139Google Scholar
  • Hollander S.The Sources of Increased Efficiency: A Study of the DuPont Rayon Plants (1965) (MIT Press, Cambridge, Massachusetts) Google Scholar
  • Irwin D. A., Klenow P. J. Learning-by-doing spillovers in the semiconductor industry. J. Political Econom. (1994) 102(6):1200–1227CrossrefGoogle Scholar
  • Jarmin R. S. Learning by doing and competition in the early rayon industry. RAND J. Econom. (1994) 25(3):441–454CrossrefGoogle Scholar
  • Judge G. G., Hill R. C., Griffiths W. E., Lutkepohl H., Lee T.-C.Introduction to the Theory and Practice of Econometrics (1988) 2nd ed.(John Wiley & Sons, New York) CrossrefGoogle Scholar
  • Kilbridge M. A model for industrial learning. Management Sci. (1962) 8LinkGoogle Scholar
  • Leachman R. C. The competitive semiconductor manufacturing survey: Third report on the results of the main phase. (1997) . Technical report Engineering Systems Research Center, University of California, BerkeleyGoogle Scholar
  • Levy F. Adaptation in the production process. Management Sci. (1965) 11:B136–B154LinkGoogle Scholar
  • Lieberman M. The learning curve and pricing in the chemical processing industries. RAND J. Econom. (1984) 15(2):213–228CrossrefGoogle Scholar
  • Murphy B. Cost-size optima of monolithic integrated circuits. Proc. IEEE (1964) 52(1):1537–1545CrossrefGoogle Scholar
  • Okabe T., Nagata M., Shimada S. Analysis of yield integrated circuits and a new expression for the yield. Electr. Engrg. in Japan (1972) 92:135–141CrossrefGoogle Scholar
  • Pisano G. P.The Development Factory: Unlocking the Potential of Process Innovation (1997) (Harvard Business School Press, Boston, Massachusetts) Google Scholar
  • Porter M. E.Competitive Strategy (1980) (Free Press, New York) Google Scholar
  • Preston L., Keachie E. Cost functions and progress functions: An integration. Amer. Econom. Rev. (1964) 54(2):100–107Google Scholar
  • Rapping L. Learning and World War II production functions. Rev. Econom. Statist. (1965) 47:81–86CrossrefGoogle Scholar
  • Sheshinski E. Tests of the learning by doing hypothesis. Rev. Econom. Statist. (1967) 49(4):568–578CrossrefGoogle Scholar
  • Stapper C. H. Defect density distribution for lsi yield calculations. IEEE Trans. Electron Devices (1973) ED-20:655–657CrossrefGoogle Scholar
  • Stapper C. H. Fact and fiction in yield modeling. Microelectronics J. (1989) 20(1–2):129–151CrossrefGoogle Scholar
  • Stobaugh R., Townsend P. Price forecasting and strategic planning: The case of petro chemicals. J. Marketing Res. (1975) 12:19–29CrossrefGoogle Scholar
  • Takahashi D. Intel plans deeper price cuts on chips in an effort to ward off competitors. Wall Street Journal (1997) B2(April 11):B5'97Google Scholar
  • Teece D. J., Pisano G., Shuen A. Dynamic capabilities and strategic management. Strategic Management J. (1997) 18(7):509–533CrossrefGoogle Scholar
  • Webbinck D. (1972) . The semiconductor industry: A survey of structure, conduct, and performance. Staff Report to the Federal Trade Commission, U.S. Government Printing Office, Washington, D.CGoogle Scholar
  • Wright T. Factors affecting the cost of airplanes. J. Aeronautical Sci. (1936) 3(4):122–128CrossrefGoogle Scholar
  • Zimmerman M. Learning effects and the commercialization of new energy technologies: The case of nuclear power. Bell J. Econom. (1982) 13:297–310CrossrefGoogle Scholar
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